Error catch and analysis for semiconductor memories using March tests

Chi Feng Wu, Chih Tsun Huang, Chih Wea Wang, Kuo Liang Cheng, Cheng Wen Wu

研究成果: Conference contribution

45 引文 斯高帕斯(Scopus)

摘要

We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and an error analyzer (ERA). We use TAGS to generate a set of test algorithms of different lengths and diagnostic resolutions for the memory under test, and use RAMSES to generate the March dictionary for each test algorithm. With the March dictionaries, ERA is able to support March algorithms for easy diagnosis of faulty RAMs. Legacy test algorithms also can be reused. When integrated with a RAM tester, our ECA system can generate RAM bitmaps that are similar to the RAM layout. The bitmaps provide detail information about the error locations and faults causing thex errors. Based on the information, diagnosis of the RAM chips for-yield and reliability improvement can be done more easily.

原文English
主出版物標題IEEE/ACM International Conference on Computer Aided Design
主出版物子標題A Conference for the EE CAD Professional, ICCAD 2000
發行者Institute of Electrical and Electronics Engineers Inc.
頁面468-471
頁數4
ISBN(電子)0780364457
DOIs
出版狀態Published - 2000 一月 1
事件IEEE/ACM International Conference on Computer Aided Design, ICCAD 2000 - San Jose, United States
持續時間: 2000 十一月 52000 十一月 9

出版系列

名字IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
2000-January
ISSN(列印)1092-3152

Conference

ConferenceIEEE/ACM International Conference on Computer Aided Design, ICCAD 2000
國家/地區United States
城市San Jose
期間00-11-0500-11-09

All Science Journal Classification (ASJC) codes

  • 軟體
  • 電腦科學應用
  • 電腦繪圖與電腦輔助設計

指紋

深入研究「Error catch and analysis for semiconductor memories using March tests」主題。共同形成了獨特的指紋。

引用此