Error signal artifact in apertureless scanning near-field optical microscopy

L. Billot, M. Lamy De La Chapelle, D. Barchiesi, S. H. Chang, S. K. Gray, J. A. Rogers, A. Bouhelier, P. M. Adam, J. L. Bijeon, G. P. Wiederrecht, R. Bachelot, P. Royer

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16 引文 斯高帕斯(Scopus)

摘要

Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal.

原文English
文章編號023105
期刊Applied Physics Letters
89
發行號2
DOIs
出版狀態Published - 2006

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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