Error signal artifact in apertureless scanning near-field optical microscopy

L. Billot, M. Lamy De La Chapelle, D. Barchiesi, S. H. Chang, S. K. Gray, J. A. Rogers, A. Bouhelier, P. M. Adam, J. L. Bijeon, G. P. Wiederrecht, R. Bachelot, P. Royer

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Physics & Astronomy