Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels

Fong Jyun Tsai, Chong Siao Ye, Yu Huang, Kuen Jong Lee, Wu Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi Xuan Zheng

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

Over the past two decades, test data compression has become a de facto technology used in large industrial designs to reduce the overall test cost. During DFT planning, it is very important to understand the impact of using different numbers of input/output channels on test coverage, test cycles, and test data volume. In this paper, an efficient method to estimate the test data volume with different input channel counts using the Embedded Deterministic Test (EDT) compression technology is proposed. The results can then be used to quickly determine the scan configuration that results in the least or near least test data volume. With this method, the total ATPG run time can be reduced by a factor of more than 10X compared to the currently used trial-and-error method.

原文English
主出版物標題Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
發行者Institute of Electrical and Electronics Engineers Inc.
頁面130-135
頁數6
ISBN(電子)9781728189444
DOIs
出版狀態Published - 2020 九月
事件4th IEEE International Test Conference in Asia, ITC-Asia 2020 - Taipei, Taiwan
持續時間: 2020 九月 232020 九月 25

出版系列

名字Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020

Conference

Conference4th IEEE International Test Conference in Asia, ITC-Asia 2020
國家Taiwan
城市Taipei
期間20-09-2320-09-25

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Information Systems and Management
  • Safety, Risk, Reliability and Quality

指紋 深入研究「Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels」主題。共同形成了獨特的指紋。

引用此