Evanescent microwave probe study on dielectric properties of materials

Hsiu Fung Cheng, Yi Chun Chen, I. Nan Lin

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

摘要

A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.

原文English
頁(從 - 到)1801-1805
頁數5
期刊Journal of the European Ceramic Society
26
發行號10-11
DOIs
出版狀態Published - 2006

All Science Journal Classification (ASJC) codes

  • 陶瓷和複合材料
  • 材料化學

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