Ex situ structural characterization during the formation of CuInS 2 thin films

Chia Hung Tsai, Jyh Ming Ting, Rui Ren Wang

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)

摘要

CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.

原文English
頁(從 - 到)349-354
頁數6
期刊Acta Materialia
59
發行號1
DOIs
出版狀態Published - 2011 一月 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

指紋 深入研究「Ex situ structural characterization during the formation of CuInS <sub>2</sub> thin films」主題。共同形成了獨特的指紋。

引用此