摘要
Actual dimension control of silicon (Si) nanowire arrays was conducted using metal-assisted chemical etching on Si patterned by electron beam lithography. The appearance of nanogaps at the edge of each nanowire provides the diffusion pathways of reactants for Si dissolution, predominantly causing distinct etching rates that depend upon the spacings of nanogaps.
原文 | English |
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頁(從 - 到) | 26711-26714 |
頁數 | 4 |
期刊 | Physical Chemistry Chemical Physics |
卷 | 16 |
發行號 | 48 |
DOIs | |
出版狀態 | Published - 2014 十一月 19 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry