Extended fault-tolerant cycle embedding in faulty hypercubes

研究成果: Article同行評審

23 引文 斯高帕斯(Scopus)

摘要

We consider fault-tolerant embedding, where an-dimensional faulty hypercube, denoted by Qn, acts as the host graph, and the longest fault-free cycle represents the guest graph. Let Fv be a set of faulty nodes in Qn. Also, let Fe be a set of faulty edges in which at least one end-node of each edge is faulty, and let Fe be a set of faulty edges in which the end-nodes of each edge are both fault-free. An edge Qn in is said to be critical if it is either fault-free or in Fe. In this paper, we prove that there exists a fault-free cycle of length at least 2n-2|Fv| in Qn (n≥3) with |Fe| ≤ 2n-5, and |Fv|+|Fe|≤2n-4, in which each node is incident to at least two critical edges. Our result improves on the previously best known results reported in the literature, where only faulty nodes or faulty edges are considered.

原文English
文章編號5332283
頁(從 - 到)702-710
頁數9
期刊IEEE Transactions on Reliability
58
發行號4
DOIs
出版狀態Published - 2009 11月 16

All Science Journal Classification (ASJC) codes

  • 安全、風險、可靠性和品質
  • 電氣與電子工程

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