Extraction of linear anisotropic parameters with scattering property by mueller optical coherence tomography for stress analysis

Chia Chi Liao, Yu-Lung Lo

研究成果: Conference contribution

摘要

Using a Mueller optical coherence tomography (OCT) to extract linear birefringence (LB) and linear dichroism (LD) parameters of the material with scatters is proposed in this study. The analytical model is derived by the differential Mueller matrix formalism that considering the reflected mode for measuring an optically anisotropic sample containing LB, LD and depolarization effect in full range measurements. In contrast to the conventional Mueller OCT system, the proposed model provides the exact solutions for the optically anisotropic parameters decoupled from the depolarization effect for actual materials. Also in comparisons with an analytical model based up a decomposition method, it is found that one based upon a differential method is much easier and more realistic for simulating the materials simultaneously containing multiple optical properties. The validity of the system is proved by the simulation results. As authors’ knowledge, this is the first concept to merge a differential method in the reflection mode in a Mueller OCT system.

原文English
主出版物標題Advancement of Optical Methods in Experimental Mechanics - Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics
編輯Luciano Lamberti, Ming-Tzer Lin, Helena Jin, Sanichiro Yoshida
發行者Springer New York LLC
頁面303-308
頁數6
ISBN(列印)9783319224459
DOIs
出版狀態Published - 2016 一月 1
事件Annual Conference on Experimental and Applied Mechanics, 2015 - Costa Mesa, United States
持續時間: 2015 六月 82015 六月 11

出版系列

名字Conference Proceedings of the Society for Experimental Mechanics Series
3
ISSN(列印)2191-5644
ISSN(電子)2191-5652

Other

OtherAnnual Conference on Experimental and Applied Mechanics, 2015
國家United States
城市Costa Mesa
期間15-06-0815-06-11

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Computational Mechanics
  • Mechanical Engineering

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