Fabrication of metal embedded photo-mask for sub-micrometer scaled photolithography and patterning sapphire substrate

Jhih Nan Yan, Yung Chun Lee

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

This paper describes the fabrication processes of a new type of metal-embedded photo-mask, which will be used in standard photolithography and for fabricating patterned sapphire substrates. This new metal-embedded photo-mask is prepared by metal contact printing lithography and therefore can easily achieve smaller feature size around or below 1 μm. Besides its easiness in fabricating and obtaining smaller line-width, this new metal-embedded photo-mask differs from a conventional Cr/glass photo-mask in that the metallic patterns are embedded and therefore are not in contact with photo-resist during UV exposure. This unique feature can minimize the damage to photo-mask in use and prolong its lifetime. In this work, this metal-embedded photo-mask is experimentally prepared and applied to photolithographic patterning of PR microstructures on sapphire substrates, which are important in LED industries.

原文English
主出版物標題2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012
發行者IEEE Computer Society
頁面36-39
頁數4
ISBN(列印)9781467311243
DOIs
出版狀態Published - 2012
事件7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012 - Kyoto, Japan
持續時間: 2012 3月 52012 3月 8

出版系列

名字2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012

Conference

Conference7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012
國家/地區Japan
城市Kyoto
期間12-03-0512-03-08

All Science Journal Classification (ASJC) codes

  • 工程(雜項)

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