Fame: A Fault-Pattern Based Memory Failure Analysis Framework

Kuo Liang Cheng, Chih Wea Wang, Jih Nung Lee, Yung Fa Chou, Chih Tsun Huang, Cheng Wen Wu

研究成果: Conference article同行評審

11 引文 斯高帕斯(Scopus)

摘要

A memory failure analysis framework is developed - the Failure Analyzer for MEmories (FAME). The FAME integrates the Memory Error Catch and Analysis (MECA) system and the Memory Defect Diagnostics (MDD) system. The fault-type based diagnostics approach used by MECA can improve the efficiency of the test and diagnostic algorithms. The fault-pattern based diagnostics approach used by MDD further improves the defect identification capability. The FAME also comes with a powerful viewer for inspecting the failure patterns and fault patterns. It provides an easy way to narrow down the potential cause of failures and identify possible defects more accurately during the memory product development and yield ramp-up stage. An experiment has been done on an industrial case, demonstrating very accurate results in a much shorter time as compared with the conventional way.

原文English
頁(從 - 到)595-598
頁數4
期刊IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
出版狀態Published - 2003 十二月 26
事件IEEE/ACM International Conference on Computer Aided Design ICCAD 2003: IEEE/ACM Digest of Technical Papers - San Jose, CA, United States
持續時間: 2003 十一月 92003 十一月 13

All Science Journal Classification (ASJC) codes

  • 軟體
  • 電腦科學應用
  • 電腦繪圖與電腦輔助設計

指紋

深入研究「Fame: A Fault-Pattern Based Memory Failure Analysis Framework」主題。共同形成了獨特的指紋。

引用此