Fault-pattern oriented defect diagnosis for flash memory

Mu Hsien Hsu, Yu Tsao Hsing, Jen Chieh Yeh, Cheng Wen Wu

研究成果: Conference contribution

3 引文 斯高帕斯(Scopus)

摘要

In order to ease the time-to-market pressure of flash memory, we propose a fault-pattern based diagnosis methodology that reduces the burden in yield learning. The fault-pattern based diagnosis approach is based on defect dictionary and ATE log file. The proposed diagnosis method allows product engineers to quickly isolate defect candidates. In this paper we use open/short defects to demonstrate our method. We propose a diagnostic test algorithm for flash memory based on the targeted defect models. The length of the new diagnostic test is shorter than previous ones, so diagnosis time can be reduced. Experimental results show that the diagnostic resolution of fault-pattern based method reaches 83.3% for a NOR-type flash, and 100% for a NAND-type flash. We also present a current test to improve the diagnostic resolution for NOR-type flash, so its diagnostic resolution can reach 100% as well.

原文English
主出版物標題Proceedings - 2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06
頁面3-8
頁數6
DOIs
出版狀態Published - 2006 十二月 1
事件2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06 - Taipei, Taiwan
持續時間: 2006 八月 22006 八月 4

出版系列

名字Records of the IEEE International Workshop on Memory Technology, Design and Testing
2006
ISSN(列印)1087-4852

Conference

Conference2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06
國家/地區Taiwan
城市Taipei
期間06-08-0206-08-04

All Science Journal Classification (ASJC) codes

  • 媒體技術

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