Formation and identification of secondary oxide phases in co-sputtered ZnO:Cr films

Y. M. Hu, C. W. Hsu, C. Y. Wang, S. S. Lee, J. W. Chiou, T. C. Han, G. J. Chen, Wei-Yang Chou, J. Chang

研究成果: Article

7 引文 斯高帕斯(Scopus)

摘要

The secondary oxide phases in ZnO:Cr films have been observed to evolve from an initial Cr2O3 phase near the film surface to a final ZnCr2O4 phase throughout the film as the Cr content is increased. Two absorption bands, corresponding to the 4A24 T1 and 4A24 T2 transitions of Cr3+, can be observed in the Cr2O3-rich sample, whereas the ZnCr2O4-rich sample is opaque at wavelengths ≤ 500 nm. Our results suggest that the formation of secondary oxide phases in ZnO:Cr films is inevitable, leading to a much lower solubility of Cr.

原文English
頁(從 - 到)2916-2919
頁數4
期刊Thin Solid Films
518
發行號10
DOIs
出版狀態Published - 2010 三月 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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  • 引用此

    Hu, Y. M., Hsu, C. W., Wang, C. Y., Lee, S. S., Chiou, J. W., Han, T. C., Chen, G. J., Chou, W-Y., & Chang, J. (2010). Formation and identification of secondary oxide phases in co-sputtered ZnO:Cr films. Thin Solid Films, 518(10), 2916-2919. https://doi.org/10.1016/j.tsf.2009.10.162