摘要
In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a `soft' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.
| 原文 | English |
|---|---|
| 頁面 | 267-272 |
| 頁數 | 6 |
| 出版狀態 | Published - 1997 1月 1 |
| 事件 | Proceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA 持續時間: 1997 4月 27 → 1997 5月 1 |
Other
| Other | Proceedings of the 1997 15th VLSI Test Symposium |
|---|---|
| 城市 | Monterey, CA, USA |
| 期間 | 97-04-27 → 97-05-01 |
All Science Journal Classification (ASJC) codes
- 電腦科學應用
- 電氣與電子工程