摘要
A GaN-based Schottky barrier diode (SBD) with a 5-pair AlGaN-GaN intermediate layer for ultraviolet (UV) photodetector (PD) was fabricated and investigated. It was found that we could achieve a smaller dark leakage current and noise level by using the 5-pair AlGaN-GaN intermediate layer. For our device biased at -5V, the responsivity at 360nm was found to be 0.26A/W and the UV-to-visible rejection ratio was estimated to be 1.83Ã - 10 4. At the same bias, it was found that minimum noise equivalent power and normalized detectivity of our device were 1.00Ã - 10 -9W and 1.45Ã - 10 9cmHz 0.5W -1, respectively. This indicates a simple and effective way to fabricate high-performance PDs for UV detection.
原文 | English |
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頁(從 - 到) | 579-584 |
頁數 | 6 |
期刊 | Physica Status Solidi (A) Applications and Materials Science |
卷 | 209 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 2012 3月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 凝聚態物理學
- 表面和介面
- 表面、塗料和薄膜
- 電氣與電子工程
- 材料化學