Global planning of accelerated degradation tests based on exponential dispersion degradation models

I. Chen Lee, Sheng Tsaing Tseng, Yili Hong

研究成果: Article

摘要

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi-analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three-level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost-constrained ADT plan, compared with conventional optimal plans by grid search algorithms.

原文English
頁(從 - 到)469-483
頁數15
期刊Naval Research Logistics
67
發行號6
DOIs
出版狀態Published - 2020 九月 1

All Science Journal Classification (ASJC) codes

  • Modelling and Simulation
  • Ocean Engineering
  • Management Science and Operations Research

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