Guest editorial

研究成果: Editorial › 同行評審

原文	English
頁（從 - 到）	15-16
頁數	2
期刊	Journal of Electronic Testing: Theory and Applications (JETTA)
卷	18
發行號	1
DOIs	https://doi.org/10.1023/A:1013719704988
出版狀態	Published - 2002 2月

All Science Journal Classification (ASJC) codes

@article{d16bac3eeacb471aab771741b4a74d19,

title = "Guest editorial",

author = "Lee, {Kuen Jong} and Su, {Chau Chin}",

year = "2002",

month = feb,

doi = "10.1023/A:1013719704988",

language = "English",

volume = "18",

pages = "15--16",

journal = "Journal of Electronic Testing: Theory and Applications (JETTA)",

issn = "0923-8174",

publisher = "Springer Netherlands",

number = "1",

}

TY - JOUR

T1 - Guest editorial

AU - Lee, Kuen Jong

AU - Su, Chau Chin

PY - 2002/2

Y1 - 2002/2

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U2 - 10.1023/A:1013719704988

DO - 10.1023/A:1013719704988

M3 - Editorial

AN - SCOPUS:0036471238

SN - 0923-8174

VL - 18

SP - 15

EP - 16

JO - Journal of Electronic Testing: Theory and Applications (JETTA)

JF - Journal of Electronic Testing: Theory and Applications (JETTA)

IS - 1

ER -