HF-Dedupe: Hierarchical Fingerprint Scheme for High Efficiency Data Deduplication on Flash-based Storage Systems

Kai Ting Weng, Yun Shan Hsieh, Yen Ting Chen, Yu Pei Liang, Yuan Hao Chang, Po Chun Huang, Wei Kuan Shih

研究成果: Conference contribution

摘要

Even though flash memory is widely used in many applications as storage due to its high performance, demands for lower storage cost and better I/O performance are still high because of the continuous growth of data. Data deduplication has the potential to address these issues by eliminating redundant writes in I/O workloads and different strategies have been proposed to improve its efficiency. However, existing designs mainly rely on time-consuming SHA-1 fingerprint scheme or byte-by-byte comparison to identify duplicate data, and these methods cause much overhead and become a bottleneck in data deduplication. To tackle this issue, we propose the hierarchical fingerprint scheme (HF-Dedupe) to improve the efficiency of data deduplication for flash-based storage systems. By leveraging multiple levels of light-weight hashes in the fingerprint, our design only takes the minimal effort to distinguish different data in write traffic. In order to evaluate our design, a series of experiments were conducted based on trace-driven simulations. Compared with other designs, the experimental results show that HF-Dedupe further reduces the deduplication time by 34.76%-65.02 % while retaining high deduplication ratio, and therefore achieves the most improvement to overall I/O performance.

原文English
主出版物標題2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350315592
DOIs
出版狀態Published - 2023
事件42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - San Francisco, United States
持續時間: 2023 10月 282023 11月 2

出版系列

名字IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN(列印)1092-3152

Conference

Conference42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023
國家/地區United States
城市San Francisco
期間23-10-2823-11-02

All Science Journal Classification (ASJC) codes

  • 軟體
  • 電腦科學應用
  • 電腦繪圖與電腦輔助設計

引用此