High-density logic techniques with reduced-stack double-gate MOSFETs

Meng-Hsueh Chiang, Keunwoo Kim, Ching Te Chuang, Christophe Tretz

研究成果: Conference article

原文English
文章編號1563544
頁(從 - 到)85-86
頁數2
期刊Proceedings - IEEE International SOI Conference
2005
DOIs
出版狀態Published - 2005 十二月 1
事件2005 IEEE International SOI Conference - Honolulu, HI, United States
持續時間: 2005 十月 32005 十月 6

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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