High dislocation density of tin induced by electric current

Yi Han Liao, Chien Lung Liang, Kwang Lung Lin, Albert T. Wu

研究成果: Article同行評審

15 引文 斯高帕斯(Scopus)

摘要

A dislocation density of as high as 1017 /m2 in a tin strip, as revealed by high resolution transmission electron microscope, was induced by current stressing at 6.5 x 103 A/ cm2. The dislocations exist in terms of dislocation line, dislocation loop, and dislocation aggregates. Electron Backscattered Diffraction images reflect that the high dislocation density induced the formation of low deflection angle subgrains, high deflection angle Widmanstätten grains, and recrystallization. The recrystallization gave rise to grain refining.

原文English
文章編號127210
期刊AIP Advances
5
發行號12
DOIs
出版狀態Published - 2015 十二月 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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