摘要
GaN Schottky diodes were built internally inside the GaN green LEDs by using etching and re-deposition techniques. By proper selecting the etching areas underneath the bonding pads, one can minimize the optical loss due to the etching process. Although the reverse current, the forward turn-on voltage and device lifetime degradation were all higher for the GaN LED with Schottky diode, it was found that the internal Schottky diode could significantly increase the ESD threshold from 450 V to 1300 V.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 91-94 |
| 頁數 | 4 |
| 期刊 | Physica Status Solidi (A) Applied Research |
| 卷 | 200 |
| 發行號 | 1 |
| DOIs | |
| 出版狀態 | Published - 2003 11月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 凝聚態物理學
指紋
深入研究「High electrostatic discharge protection of InGaN/GaN MQW LEDs by using GaN Schottky diodes」主題。共同形成了獨特的指紋。引用此
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