TY - JOUR
T1 - High-power GaN-based light-emitting diodes with transparent indium zinc oxide films
AU - Uang, Kai Ming
AU - Wang, Shui Jinn
AU - Chen, Shiue Lung
AU - Chin-Kun, W. U.
AU - Chang, Shu Cheng
AU - Chen, Tron Min
AU - Liou, Bor Wen
PY - 2005/4
Y1 - 2005/4
N2 - Large-area (0.6 mm × 0.6 mm-1.5 mm × 1.5 mm), high-power GaN-based blue-light-emitting diodes (LEDs) with an indium zinc oxide (IZO) overlay as a transparent conduction layer (TCL) and the effects of the overlayer on light output power (Lop) improvement are investigated. Experimental results show that sputter-deposited IZO TCLs with thicknesses in the range of 100-500 nm have a low resistivity ranging from 12.1-3.1 × 10-4 Ω-cm and a transparency ≥80% in the visible light range. The benefit obtained from the use of an IZO TCL is much more profound in LEDs of larger chip size; in addition, the optimum IZO TCL thickness is approximately 300 nm. As compared to the case without an IZO layer, under an injection current of 60-1000 mA, a 39-90% improvement in Lop has been achieved from LEDs (1.5 mm × 1.5 mm) with a 300-nm-thick IZO TCL.
AB - Large-area (0.6 mm × 0.6 mm-1.5 mm × 1.5 mm), high-power GaN-based blue-light-emitting diodes (LEDs) with an indium zinc oxide (IZO) overlay as a transparent conduction layer (TCL) and the effects of the overlayer on light output power (Lop) improvement are investigated. Experimental results show that sputter-deposited IZO TCLs with thicknesses in the range of 100-500 nm have a low resistivity ranging from 12.1-3.1 × 10-4 Ω-cm and a transparency ≥80% in the visible light range. The benefit obtained from the use of an IZO TCL is much more profound in LEDs of larger chip size; in addition, the optimum IZO TCL thickness is approximately 300 nm. As compared to the case without an IZO layer, under an injection current of 60-1000 mA, a 39-90% improvement in Lop has been achieved from LEDs (1.5 mm × 1.5 mm) with a 300-nm-thick IZO TCL.
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U2 - 10.1143/JJAP.44.2516
DO - 10.1143/JJAP.44.2516
M3 - Article
AN - SCOPUS:21244496765
SN - 0021-4922
VL - 44
SP - 2516
EP - 2519
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 4 B
ER -