High-resolution x-ray diffraction and transmission electron microscopy of multiferroic BiFeO3 films

Xiaoding Qi, Ming Wei, Yuan Lin, Quanxi Jia, Dan Zhi, Joonghoe Dho, Mark G. Blamire, Judith L. MacManus-Driscoll

研究成果: Article同行評審

109 引文 斯高帕斯(Scopus)

摘要

High-resolution x-ray diffraction and transmission electron microscopy (TEM) have been used to study BiFeO3 thin films grown on the bare and SrRuO3 buffered (001) SrTiO3 substrates. Reciprocal space mapping (RSM) around (002) and (103) reflections revealed that BFO films with a thickness of about 200 nm were almost fully relaxed and had a rhombohedral structure. Cross-sectional, high-resolution TEM showed that the films started to relax at a very early stage of growth, which was consistent with the RSM results. A thin intermediate layer of about 2 nm was observed at the interface, which had a smaller lattice than the overgrown film. Twist distortions about the c axis to release the shear strain introduced by the growth of rhombic (001) BiFeO3 on cubic (001) SrTiO3 were also observed. The results indicate that a strained, coherent BiFeO3 film on (001) SrTiO3 is very difficult to maintain and (111) STO substrates are preferable.

原文English
文章編號071913
頁(從 - 到)1-3
頁數3
期刊Applied Physics Letters
86
發行號7
DOIs
出版狀態Published - 2005 二月 14

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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