High-speed low-voltage built-in current sensor

T. C. Huang, M. C. Huang, K. J. Lee

研究成果: Paper

15 引文 斯高帕斯(Scopus)

摘要

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

原文English
頁面90-94
頁數5
出版狀態Published - 1997 十二月 1
事件Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA
持續時間: 1997 十一月 51997 十一月 6

Other

OtherProceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing
城市Washington, DC, USA
期間97-11-0597-11-06

All Science Journal Classification (ASJC) codes

  • Engineering(all)

指紋 深入研究「High-speed low-voltage built-in current sensor」主題。共同形成了獨特的指紋。

  • 引用此

    Huang, T. C., Huang, M. C., & Lee, K. J. (1997). High-speed low-voltage built-in current sensor. 90-94. 論文發表於 Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing, Washington, DC, USA, .