High-speed low-voltage built-in current sensor

T. C. Huang, M. C. Huang, K. J. Lee

研究成果: Paper同行評審

17 引文 斯高帕斯(Scopus)

摘要

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

原文English
頁面90-94
頁數5
出版狀態Published - 1997
事件Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA
持續時間: 1997 11月 51997 11月 6

Other

OtherProceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing
城市Washington, DC, USA
期間97-11-0597-11-06

All Science Journal Classification (ASJC) codes

  • 一般工程

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