High temperature power factor measurement system for thermoelectric materials

Sim Y. Loo, Kuei Fang Hsu, Mercouri G. Kanatzidis, Timothy P. Hogan

研究成果: Paper

3 引文 斯高帕斯(Scopus)

摘要

A new computer-controlled thermoelectric measurement system is presented to characterize the thermoelectric properties of new materials, primarily at high temperature (up to 800K). Thermoelectric research at high temperature is of interest since materials with high thermoelectric efficiency at high temperatures have potential applications in power generation. Using this system, we can study the new materials properties over a very broad temperature range. This system was designed to measure the thermoelectric power through a slope measurement technique, and electrical conductivity in the standard four-probe configuration. Various ways of measuring the electrical conductivity are investigated, for instance through I-V sweeping, flipping the source current directions, and ac techniques. Here we present the use of this high temperature system in studying the properties of new materials over a very broad temperature range (80-800K). Various reference materials for thermoelectric power and electrical conductivity are characterized in this system and show good agreement with the reference data. Renewed interest in the field of thermoelectricity (TE) has stimulated scientists in the TE community to investigate new aspects of this research, for instance, new materials synthesis techniques, new material characterization systems, and new ways of designing thermoelectric materials. Recently, many studies have concentrated on thermoelectric power generation applications. This is due to the increasingly important issue of recovery waste heat, e.g. in automobiles and systems that output large amounts of waste heat.

原文English
頁面247-256
頁數10
出版狀態Published - 2003 十二月 1
事件Low Temperature Electronics and Low Temperature Cofired Ceramic Based Electronic Devices - Orlando, FL, United States
持續時間: 2003 十月 122003 十月 16

Other

OtherLow Temperature Electronics and Low Temperature Cofired Ceramic Based Electronic Devices
國家United States
城市Orlando, FL
期間03-10-1203-10-16

    指紋

All Science Journal Classification (ASJC) codes

  • Engineering(all)

引用此

Loo, S. Y., Hsu, K. F., Kanatzidis, M. G., & Hogan, T. P. (2003). High temperature power factor measurement system for thermoelectric materials. 247-256. 論文發表於 Low Temperature Electronics and Low Temperature Cofired Ceramic Based Electronic Devices, Orlando, FL, United States.