| 原文 | English |
|---|---|
| 主出版物標題 | IEEE Int. Workshop on Memory Technology, Design and Testing (MTDT) |
| 出版地 | Taipei |
| 出版狀態 | Published - 2007 12月 |
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How Far can We Go in Wireless Testing of Memory Chips and Wafers?
- Cheng-Wen Wu
研究成果: Conference contribution