How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology

H. L. Chiang, R. A. Hadi, J. F. Wang, H. C. Han, J. J. Wu, H. H. Hsieh, J. J. Horng, W. S. Chou, B. S. Lien, C. H. Chang, Y. C. Chen, Y. H. Wang, T. C. Chen, J. C. Liu, Y. C. Liu, M. H. Chiang, K. H. Kao, B. Pulicherla, J. Cai, C. S. ChangK. W. Su, K. L. Cheng, T. J. Yeh, Y. C. Peng, C. Enz, M. C.F. Chang, M. F. Chang, H. S.P. Wong, I. P. Radu

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

Given the limited space and cooling capacity in dilution refrigerators, it is challenging to scale the number of qubits for a fault-tolerant quantum computer (QC). In this paper, we study a custom-scaled CMOS technology to overcome the constraints in the dilution refrigerators. With Cryo-Design/ Technology CoOptimization (Cryo-DTCO) in an advanced node, one can then reduce the control power from 26.8 mW/ qubit to 8.4 mW/ qubit (∼ 0.31 ×). Projections suggest this may be sufficient to enable error corrections via surface codes for fault-tolerant computing.

原文English
主出版物標題2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9784863488069
DOIs
出版狀態Published - 2023
事件2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023 - Kyoto, Japan
持續時間: 2023 6月 112023 6月 16

出版系列

名字Digest of Technical Papers - Symposium on VLSI Technology
2023-June
ISSN(列印)0743-1562

Conference

Conference2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023
國家/地區Japan
城市Kyoto
期間23-06-1123-06-16

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

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