HRTEM study of the extended defect structure in epitaxial Ba0.3Sr0.7TiO3 thin films grown on (001) LaAlO3

C. J. Lu, L. A. Bendersky, K. Chang, I. Takeuchi

研究成果: Conference article

1 引文 斯高帕斯(Scopus)


The defect structure of a 350-nm-thick epitaxial Ba0.3Sr0.7TiO3 thin film grown on (001) LaAlO3 has been investigated using conventional and high-resolution transmission electron microscopy. The predominant defects in the film are threading dislocations (TDs) with Burgers vectors b = <100> and <110>. A high density of extended stacking faults (SFs) with displacement vectors R = (1/2)<110> were also observed in the near-interface region of the film. The faults are associated with dissociated dislocations and partial halfloops. Some findings about dislocation dissociation and the atomic structure of the (1/2)<110> faults are observed for the first time in perovskites to our knowledge. The mechanisms for the generation, dissociation and evolution of the TDs as well as for the formation mechanism of the SFs are discussed.

頁(從 - 到)37-42
期刊Materials Research Society Symposium - Proceedings
出版狀態Published - 2003 七月 28
事件Structure-Property Relationships of Oxide Surfaces and Interfaces II - Boston, MA, United States
持續時間: 2002 十二月 22002 十二月 3


All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering