@inproceedings{1a36c8778c984a89979c1a79002b2c0a,
title = "Identification of Edge Recombination from CIGS Solar Cells",
abstract = "CIGS solar cells has high opportunity to achieve high efficiency. The analysis of efficiency loss plays an important role for efficiency boost. The recombination loss often occurs at junction, bulk, surface, and edge position and leads to solar cell efficiency loss. Electroluminescence from defect-related optical transition is applied for defect analysis in CIGS solar cells. The micro-QE measurement is used for edge recombination analysis and reveals the recombination behavior of CIGS solar cells. EQE response at short wavelength region represents the quality of shallow region along light incident direction and used in the edge recombination study as well as EL intensity distribution.",
author = "Lin, {Shih Hung} and Lu, {Yan Chih} and Tai, {Cheng Chi} and Cheng Tzu-Huan",
year = "2019",
month = jul,
doi = "10.23919/AM-FPD.2019.8830632",
language = "English",
series = "AM-FPD 2019 - 26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "AM-FPD 2019 - 26th International Workshop on Active-Matrix Flatpanel Displays and Devices",
address = "United States",
note = "26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2019 ; Conference date: 02-07-2019 Through 05-07-2019",
}