Imaging and characterization of piezoelectric potential in a single bent ZnO microwire

Chiang Lun Wang, Shu Ju Tsai, Jhih Wei Chen, Hong Wei Shiu, Lo Yueh Chang, Kai Hsiang Lin, Hsu Cheng Hsu, Yi Chun Chen, Chia Hao Chen, Chung Lin Wu

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

摘要

We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.

原文English
文章編號123115
期刊Applied Physics Letters
105
發行號12
DOIs
出版狀態Published - 2014 9月 22

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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