Impact of stress-memorization technique induced-tensile strain on low frequency noise in n-channel metal-oxide-semiconductor transistors

Cheng Wen Kuo, San Lein Wu, Shoou Jinn Chang, Yao Tsung Huang, Yao Chin Cheng, Osbert Cheng

研究成果: Article › 同行評審

11 引文 斯高帕斯（Scopus）

指紋

深入研究「Impact of stress-memorization technique induced-tensile strain on low frequency noise in n-channel metal-oxide-semiconductor transistors」主題。共同形成了獨特的指紋。

Engineering

Keyphrases