Impact of stress-memorization technique induced-tensile strain on low frequency noise in n-channel metal-oxide-semiconductor transistors
- Cheng Wen Kuo
- , San Lein Wu
- , Shoou Jinn Chang
- , Yao Tsung Huang
- , Yao Chin Cheng
- , Osbert Cheng
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引文
斯高帕斯（Scopus）