摘要
We characterize and improve epitaxial silicon films for solar cells grown by hot-wire chemical vapor deposition (HWCVD). The hot-wire filament temperature is found to affect the incorporation of impurities and the surface roughness of the films. Lowering the filament temperature leads to improved epitaxial films with lower impurities and smoother surfaces. Solar cells made with the improved material grown on low-cost silicon templates have open-circuit voltages (V OC) ∼600 mV and efficiency exceeding 10%.
| 原文 | English |
|---|---|
| 主出版物標題 | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 |
| 發行者 | Institute of Electrical and Electronics Engineers Inc. |
| 頁面 | 51-53 |
| 頁數 | 3 |
| ISBN(列印) | 9781479932993 |
| DOIs | |
| 出版狀態 | Published - 2013 |
| 事件 | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States 持續時間: 2013 6月 16 → 2013 6月 21 |
出版系列
| 名字 | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN(列印) | 0160-8371 |
Other
| Other | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 |
|---|---|
| 國家/地區 | United States |
| 城市 | Tampa, FL |
| 期間 | 13-06-16 → 13-06-21 |
UN SDG
此研究成果有助於以下永續發展目標
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SDG 7 經濟實惠的清潔能源
All Science Journal Classification (ASJC) codes
- 控制與系統工程
- 工業與製造工程
- 電氣與電子工程
指紋
深入研究「Improved 750°C epitaxial crystal silicon solar cells through impurity reduction」主題。共同形成了獨特的指紋。引用此
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