摘要
The InGaN-based light-emitting diode (LED) with a clear p-GaN/n-GaN barrier junction is fabricated and investigated. Due to the built-in potential induced by this junction, superior current spreading performance is achieved. In addition, the suppression of current crowding phenomenon yields the reduced parasitic effect. Therefore, under an injection current of 20 mA, improved behaviors including lower turn-on voltage, lower parasitic series resistance, and significantly enhanced electrostatic discharge (ESD) performance are presented.
原文 | English |
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頁(從 - 到) | 330-333 |
頁數 | 4 |
期刊 | Displays |
卷 | 32 |
發行號 | 5 |
DOIs | |
出版狀態 | Published - 2011 12月 |
All Science Journal Classification (ASJC) codes
- 人機介面
- 硬體和架構
- 電氣與電子工程