@inproceedings{3ab2e75df85a4b9297bbff6d17d036df,
title = "Improved Electrical Stability of Zr-IGZO Thin-Film Transistors with Zr0.85Si0.15O2 Gate Dielectric",
author = "Zhi-Kai Zhuang and Shui-Jinn Wang and Wang, \{Sheng Yi\} and Chen, \{Hsiang Yi\} and Liao, \{Chun Kai\} and Hsiao, \{Sheng Tsang\} and You, \{Bing Cheng\} and Rong-Ming Ko",
year = "2018",
month = sep,
day = "11",
language = "English",
booktitle = "2018 International Conference on Solid State Devices and Materials (SSDM{\textquoteright}18)",
}