Improvement of luminance degradation via the top emission structure for AMOLED displays

Chih-Lung Lin; Yu Zhan Tsai; Kuan Wen Chou; Chun Da Tu

Improvement of luminance degradation via the top emission structure for AMOLED displays

Chih-Lung Lin, Yu Zhan Tsai, Kuan Wen Chou, Chun Da Tu

電機工程學系

研究成果: Paper › 同行評審

摘要

A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

原文	English
出版狀態	Published - 2009 12月 1
事件	2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009 - Taipei, Taiwan 持續時間: 2009 4月 27 → 2009 4月 30

Other

Other	2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009
國家/地區	Taiwan
城市	Taipei
期間	09-04-27 → 09-04-30

All Science Journal Classification (ASJC) codes

電腦繪圖與電腦輔助設計
電腦科學應用
人機介面

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title = "Improvement of luminance degradation via the top emission structure for AMOLED displays",

abstract = "A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.",

author = "Chih-Lung Lin and Tsai, {Yu Zhan} and Chou, {Kuan Wen} and Tu, {Chun Da}",

year = "2009",

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T1 - Improvement of luminance degradation via the top emission structure for AMOLED displays

AU - Lin, Chih-Lung

AU - Tsai, Yu Zhan

AU - Chou, Kuan Wen

AU - Tu, Chun Da

PY - 2009/12/1

Y1 - 2009/12/1

N2 - A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

AB - A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

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M3 - Paper

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T2 - 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009

Y2 - 27 April 2009 through 30 April 2009

ER -

Improvement of luminance degradation via the top emission structure for AMOLED displays

摘要

Other

All Science Journal Classification (ASJC) codes

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