Improvement of poly-pimple-induced device mismatch on 6T-SRAM at 65-nm CMOS technology

Chan Yuan Hu, Jone F. Chen, Shih Chih Chen, Shoou Jinn Chang, Kay Ming Lee, Chih Ping Lee

研究成果: Article › 同行評審

1 引文 斯高帕斯（Scopus）

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Engineering & Materials Science

Chemical Compounds