跳至主導覽 跳至搜尋 跳過主要內容

Improvement of the short-circuit current density and efficiency in micromorph tandem solar cells by an anti-reflection layer

  • Ping Kuan Chang
  • , Po Tsung Hsieh
  • , Fu Ji Tsai
  • , Chun Hsiung Lu
  • , Chih Hung Yeh
  • , Mau Phon Houng

研究成果: Article同行評審

7   !!Link opens in a new tab 引文 斯高帕斯(Scopus)

摘要

An anti-reflection layer has been fabricated and applied in micromorph tandem (a-Si:H/μc-Si:H) solar cells. In this work, the porous anti-reflection layers are produced on glass substrates by plasma enhanced chemical vapor deposition using a CF4 and O2 gas mixture. The process is simple and easily controlled. The tandem solar cells with the anti-reflection layer show the increased short-circuit current density of the solar cells due to increased light transmittance from air/glass interface. With the anti-reflection layer, the short-circuit current density of the tandem cell increases by 0.29 mA/cm2. Meanwhile, the solar cell efficiency increases from 11.15% to 11.55% (3.5% in relative) which allows us to develop more efficient a-Si based solar cells.

原文English
頁(從 - 到)550-553
頁數4
期刊Thin Solid Films
520
發行號1
DOIs
出版狀態Published - 2011 10月 31

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 表面和介面
  • 表面、塗料和薄膜
  • 金屬和合金
  • 材料化學

指紋

深入研究「Improvement of the short-circuit current density and efficiency in micromorph tandem solar cells by an anti-reflection layer」主題。共同形成了獨特的指紋。

引用此