摘要
A semiconducting single-walled carbon nanotube (s-SWNT) FET was prepared using the simple technique of selective extraction. The Raman spectrum of the transistor reveals that the metallic SWNTs and regioregular poly(3-dodecylthiophene) were completely removed, leaving only s-SWNTs. The drain current-drain voltage ( ID-VDS) characteristics of an SWNT FET device in the dark were measured. The transistor fabricated by our selective extraction exhibits a high ON/OFF ratio of 107 and a subthreshold swing of 154 mV/decade. The effective s-SWNT sorting process herein can be applied to further devices in the future.
原文 | English |
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文章編號 | 7422774 |
頁(從 - 到) | 1749-1753 |
頁數 | 5 |
期刊 | IEEE Transactions on Electron Devices |
卷 | 63 |
發行號 | 4 |
DOIs | |
出版狀態 | Published - 2016 4月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 電氣與電子工程