Impurity ion diagnostics in the GAMMA 10 plasma

M. Yoshikawa, Y. Okamoto, E. Kawamori, C. Watabe, Y. Watanabe, T. Furukawa, K. Ikeda, N. Yamaguchi, T. Tamano, K. Yatsu

研究成果: Conference article同行評審

10 引文 斯高帕斯(Scopus)


We constructed spectroscopic measurement systems that cover the wavelength range from soft X-ray (SC) to visible lights for impurity ion diagnostics in the GAMMA 10. We observed the absolute impurity line intensities, Doppler line broadening and time dependent radial profiles of the impurity ion emissions. We determined the radiation loss and impurity ion density in the GAMMA 10.

頁(從 - 到)289-292
期刊Fusion Technology
發行號1 T
出版狀態Published - 2001 一月
事件International Conference on Open Magnetic Systems for Plasma Confinement - Tsukuba, Jpn
持續時間: 2000 七月 32000 七月 6

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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