In-plane thermoelectric properties of Si/Ge superlattice

W. L. Liu, T. Borca-Tasciuc, J. L. Liu, K. Taka, K. L. Wang, M. S. Dresselhaus, G. Chen

研究成果: Paper同行評審

11 引文 斯高帕斯(Scopus)

摘要

In this paper we report experimental investigation of the in-plane thermoelectric properties of Si/Ge superlattices grown on silicon-on-insulator wafers. A two-wire 3ω method was employed to measure the in-plane thermal conductivity of the superlattice sample investigated. The in-plane Seebeck coefficient and electrical conductivity of the same sample are also measured. Experimental data are compared with the results of theoretical models of carrier transport based on carrier pocket engineering and partial diffuse phonon interface scattering.

原文English
頁面340-343
頁數4
出版狀態Published - 2001
事件20th International Conference on Thermoelectrics ICT'01 - Beijing, China
持續時間: 2001 六月 82001 六月 11

Conference

Conference20th International Conference on Thermoelectrics ICT'01
國家China
城市Beijing
期間01-06-0801-06-11

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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