摘要
InGaN/GaN multiquantum well (MQW) p-n junction photodetectors with semi-transparent Ni/Au electrodes were fabricated and characterized. It was found that the fabricated InGaN/GaN MQW p-n junction photodetectors exhibit a 20 V breakdown voltage and a 3.5 V forward 20 mA turn on voltage. It was also found that the photocurrent to dark current contrast ratio is higher than 105 when a 0.4 V reverse bias was applied to the InGaN/GaN MQW p-n junction photodetectors. Furthermore, it was found that the maximum responsivity was 1.28 and 1.76 A/W with a 0.1 and 3 V applied reverse bias, respectively.
原文 | English |
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頁(從 - 到) | 2227-2229 |
頁數 | 3 |
期刊 | Solid-State Electronics |
卷 | 46 |
發行號 | 12 |
DOIs | |
出版狀態 | Published - 2002 12月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 凝聚態物理學
- 材料化學
- 電氣與電子工程