摘要
In this letter, a new InGaP/GaAs superlattice-emitter resonant tunneling bipolar transistor (SE-RTBT) is fabricated and demonstrated. A 5-period InGaP/GaAs superlattice is used to serve the RT route and the confinement barrier for minority carriers. Due to the large valence band discontinuity (ΔEV) at the InGaP/GaAs heterointerface, a high current gain (βmax ≈220) is obtained. Furthermore, the interesting N-shaped negative-differential-resistance (NDR) phenomena resulting from RT effect are found both in the saturation and forward-active region of current-voltage characteristics at room temperature.
原文 | English |
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頁面 | 240-242 |
頁數 | 3 |
出版狀態 | Published - 1999 |
事件 | Proceedings of the 1998 Conference on Optoelectronic and Microelectronic Materials and Devices - Perth, WA, Aust 持續時間: 1998 12月 14 → 1998 12月 16 |
Other
Other | Proceedings of the 1998 Conference on Optoelectronic and Microelectronic Materials and Devices |
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城市 | Perth, WA, Aust |
期間 | 98-12-14 → 98-12-16 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料