TY - JOUR
T1 - Injection pulling mitigation in CMOS voltage-controlled oscillator using a novel honeycomb-shaped planar inductor
AU - Seow, Boon Eu
AU - Lin, Shih Tang
AU - Huang, Tzuen Hsi
AU - Chuang, Huey Ru
N1 - Funding Information:
Manuscript received February 25, 2018; accepted April 3, 2018. Date of publication April 12, 2018; date of current version December 20, 2018. This work was supported by the Ministry of Science and Technology, Taiwan, under Contract MOST 105-2221-E-006-243. This brief was recommended by Associate Editor G. Torfs. (Corresponding author: Tzuen-Hsi Huang.) B.-E. Seow and H.-R. Chuang are with the Institute of Computer and Communication Engineering, National Cheng Kung University, Tainan 70101, Taiwan (e-mail: [email protected]; [email protected]).
Publisher Copyright:
© 2004-2012 IEEE.
PY - 2019/1
Y1 - 2019/1
N2 - This brief presents the injection pulling mitigation of a voltage-controlled oscillator (VCO) using a novel honeycomb-shaped planar inductor. Due to the twisted routes of the sub-coils in the proposed inductor, the interference caused by a nearby electromagnetic noise source can be compensated and reduced. By using a 0.18-μm standard CMOS process, the proposed inductor and a conventional single-turn spiral inductor in a similar size are integrated into two respective VCO testchips. The injection pulling behaviors of these two oscillators are studied and compared. The experimental results show that the VCO integrated with the proposed honeycomb-shaped planar inductor can significantly mitigate the injection pulling phenomenon as compared with the VCO integrated with a conventional single-turn inductor in a similar size. In this brief, the enhancement of mitigation over 15 dB can be achieved.
AB - This brief presents the injection pulling mitigation of a voltage-controlled oscillator (VCO) using a novel honeycomb-shaped planar inductor. Due to the twisted routes of the sub-coils in the proposed inductor, the interference caused by a nearby electromagnetic noise source can be compensated and reduced. By using a 0.18-μm standard CMOS process, the proposed inductor and a conventional single-turn spiral inductor in a similar size are integrated into two respective VCO testchips. The injection pulling behaviors of these two oscillators are studied and compared. The experimental results show that the VCO integrated with the proposed honeycomb-shaped planar inductor can significantly mitigate the injection pulling phenomenon as compared with the VCO integrated with a conventional single-turn inductor in a similar size. In this brief, the enhancement of mitigation over 15 dB can be achieved.
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U2 - 10.1109/TCSII.2018.2826138
DO - 10.1109/TCSII.2018.2826138
M3 - Article
AN - SCOPUS:85045301836
SN - 1549-7747
VL - 66
SP - 6
EP - 10
JO - IEEE Transactions on Circuits and Systems II: Express Briefs
JF - IEEE Transactions on Circuits and Systems II: Express Briefs
IS - 1
M1 - 8336914
ER -