TY - JOUR
T1 - Intelligent prognostics system design and implementation
AU - Su, Yu Chuan
AU - Cheng, Fan Tien
AU - Hung, Min Hsiung
AU - Huang, Hsien Cheng
N1 - Funding Information:
Manuscript received November 29, 2004; revised December 19, 2005. This work was supported by the National Science Council, R.O.C., under Contracts NSC-94-2212-E006-006 and NSC-93-2622-E-006-005.
PY - 2006/5
Y1 - 2006/5
N2 - This paper proposes an intelligent prognostics system (IPS) for semiconductor and TFT-LCD manufacturing. The IPS comprises several generic embedded devices (GEDs) and remote clients. The GED can be easily embedded into various types of equipment to acquire equipment engineering data and meet the specification requirements of Interface A for supporting semiconductor industry equipment engineering capabilities. Furthermore, the GED has an open-standard application interface offering pluggable and customized intelligent applications. With this feature, the intelligent applications can be distributed and localized, releasing the factory network burden and enhancing equipment reliability and processing quality. This paper also develops two typical pluggable applications: the predictive maintenance scheme (PMS) for detecting equipment faults and the virtual metrology scheme (VMS) for conjecturing equipment-processing quality. Integrating the PMS into the IPS and the VMS into the IPS are, respectively, accomplished using the conveyor equipment and the sputtering equipment in a TFT-LCD factory. These two illustrative examples clearly demonstrate that IPS is versatile, configurable, and effective.
AB - This paper proposes an intelligent prognostics system (IPS) for semiconductor and TFT-LCD manufacturing. The IPS comprises several generic embedded devices (GEDs) and remote clients. The GED can be easily embedded into various types of equipment to acquire equipment engineering data and meet the specification requirements of Interface A for supporting semiconductor industry equipment engineering capabilities. Furthermore, the GED has an open-standard application interface offering pluggable and customized intelligent applications. With this feature, the intelligent applications can be distributed and localized, releasing the factory network burden and enhancing equipment reliability and processing quality. This paper also develops two typical pluggable applications: the predictive maintenance scheme (PMS) for detecting equipment faults and the virtual metrology scheme (VMS) for conjecturing equipment-processing quality. Integrating the PMS into the IPS and the VMS into the IPS are, respectively, accomplished using the conveyor equipment and the sputtering equipment in a TFT-LCD factory. These two illustrative examples clearly demonstrate that IPS is versatile, configurable, and effective.
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U2 - 10.1109/TSM.2006.873512
DO - 10.1109/TSM.2006.873512
M3 - Article
AN - SCOPUS:33646730899
SN - 0894-6507
VL - 19
SP - 195
EP - 206
JO - IEEE Transactions on Semiconductor Manufacturing
JF - IEEE Transactions on Semiconductor Manufacturing
IS - 2
ER -