TY - CHAP
T1 - Intelligent Yield Management (IYM)
AU - Hsieh, Yu Ming
AU - Lin, Chin Yi
AU - Cheng, Fan Tien
N1 - Publisher Copyright:
© 2022 The Institute of Electrical and Electronics Engineers, Inc.
PY - 2021/1/1
Y1 - 2021/1/1
N2 - This chapter introduces the traditional root-cause search procedure of a yield loss. It presents a more systematic and efficient tool: the intelligent yield management (IYM) system for finding the root causes of a yield loss. The purpose of the IYM system is to figure out the root causes which affect the yield of the final product effectively. The kernel of the IYM system is the Keyvariable Search Algorithm (KSA) scheme. The KSA scheme contains various data preprocessing modules, KSA module, reliance index module, blind-stage search algorithm, and interaction-effect search algorithm. After elaborating the theoretical illustrations of the IYM system, the chapter introduces the deployment considerations and requirements of the IYM system. Five steps are required to deploy the IYM system into manufacturing processes. They are operation analysis, IYM system setup, data collection, IYM function and integration tests, and system release.
AB - This chapter introduces the traditional root-cause search procedure of a yield loss. It presents a more systematic and efficient tool: the intelligent yield management (IYM) system for finding the root causes of a yield loss. The purpose of the IYM system is to figure out the root causes which affect the yield of the final product effectively. The kernel of the IYM system is the Keyvariable Search Algorithm (KSA) scheme. The KSA scheme contains various data preprocessing modules, KSA module, reliance index module, blind-stage search algorithm, and interaction-effect search algorithm. After elaborating the theoretical illustrations of the IYM system, the chapter introduces the deployment considerations and requirements of the IYM system. Five steps are required to deploy the IYM system into manufacturing processes. They are operation analysis, IYM system setup, data collection, IYM function and integration tests, and system release.
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U2 - 10.1002/9781119739920.ch10
DO - 10.1002/9781119739920.ch10
M3 - Chapter
AN - SCOPUS:85133099769
SN - 9781119739890
SP - 377
EP - 407
BT - Industry 4.1
PB - wiley
ER -