Intersubband absorption in Sb δ-doped Si/Si1-xGe x quantum well structures grown on Si (110)

Chanho Lee, K. L. Wang

研究成果: Article同行評審

31 引文 斯高帕斯(Scopus)

摘要

Strong electron intersubband infrared absorption is observed for Sb δ-doped Si/Si1-xGex multiple quantum well structures grown on (110) Si substrates. The intersubband absorption is shown to be allowed for both the optical field components perpendicular and parallel to the quantum wells due to the tilted ellipsoidal of constant energy surfaces. About 90% infrared absorption is measured by a Fourier transform infrared spectrometer using a waveguide structure with 10 internal reflections. For various samples used in experiments, absorption peaks ranging from 4.9 to 5.8 μm are observed. The peak energy is shown to be tunable by changing the Ge composition in the Si1-xGex barriers and the doping concentration in the Si quantum wells.

原文English
頁(從 - 到)2264-2266
頁數3
期刊Applied Physics Letters
60
發行號18
DOIs
出版狀態Published - 1992

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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