Investigation into the lateral junction growth of single asperity contact using static atomistic simulations

Yeau Ren Jeng, Shin Rung Peng

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

摘要

According to continuum mechanics theory, the metallic junctions formed between the contact asperities on two opposing surfaces increase in size until gross sliding occurs. Our atomistic simulations reveal that the onset of lateral junction growth is caused by the slips of the asperity atoms. Furthermore, it is shown that the presence of an adsorbed layer on the asperity surface delays the onset of lateral junction growth. The present simulation results are found to be consistent with the experimental results presented in the literature and provide a valuable interpretation of the lateral junction growth phenomenon from a nanoscale perspective.

原文English
文章編號163103
期刊Applied Physics Letters
94
發行號16
DOIs
出版狀態Published - 2009 5月 6

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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