Investigation of degradation for ohmic performance of oxidized Au/Ni/Mg-doped GaN

Yow Jon Lin, Zhen Dao Li, Chou Wei Hsu, Feng Tso Chien, Ching Ting Lee, Sheng Tien Shao, Hsing Cheng Chang

研究成果: Article同行評審

16 引文 斯高帕斯(Scopus)

摘要

The degradation of ohmic performance of oxidized Au/Ni/Mg-doped GaN was investigated. Cserveny's concept was applied in the investigation and x-ray photoelectron spectroscopy was performed. It was found that an increase of hole concentration of NiOx would lead to the increasing barrier height and the increasing specific contact resistance of oxidized Au/Ni/Mg-doped GaN.

原文English
頁(從 - 到)2817-2819
頁數3
期刊Applied Physics Letters
82
發行號17
DOIs
出版狀態Published - 2003 四月 28

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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