TY - JOUR
T1 - Investigation of InGaAs based pseudomorphic step-doped-channel field-effect transistor (SDCFET)
AU - Lin, Kun Wei
AU - Laih, Lih Wen
AU - Liu, Wen Chau
N1 - Funding Information:
Acknowledgements-Thiss tudy was supported by the National ScienceC ouncil of the Republico f China under Contractn o. NSC 86-2215-E-006-005.
PY - 1997/3
Y1 - 1997/3
N2 - A heterostructure field-effect transistor (HFET) with a pseudomorphic step-doped-channel (SDC) profile has been fabricated and investigated. The studied SDCFET provides the advantages of high current density, high breakdown voltage, large gate voltage swing for high transconductance operation, and the adjustable threshold voltage. In this paper, a theoretical model is built to analyze the DC performance. For a practical device of 1 x 100 μm2 gated dimension, a maximum drain saturation current of 735 mAmm-1, a maximum transconductance of 200 mSmm-1, a gate breakdown voltage of 15 V, a wide gate voltage swing of 3.3 V with transconductance (gm) higher than 150 mSmm-1 and a threshold voltage of -3.7 V are obtained, respectively. The theoretical data are consistent with experimental results. These good performances show the studied SDCFET have promise for high-speed, high-power circuit applications.
AB - A heterostructure field-effect transistor (HFET) with a pseudomorphic step-doped-channel (SDC) profile has been fabricated and investigated. The studied SDCFET provides the advantages of high current density, high breakdown voltage, large gate voltage swing for high transconductance operation, and the adjustable threshold voltage. In this paper, a theoretical model is built to analyze the DC performance. For a practical device of 1 x 100 μm2 gated dimension, a maximum drain saturation current of 735 mAmm-1, a maximum transconductance of 200 mSmm-1, a gate breakdown voltage of 15 V, a wide gate voltage swing of 3.3 V with transconductance (gm) higher than 150 mSmm-1 and a threshold voltage of -3.7 V are obtained, respectively. The theoretical data are consistent with experimental results. These good performances show the studied SDCFET have promise for high-speed, high-power circuit applications.
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U2 - 10.1016/S0038-1101(96)00187-6
DO - 10.1016/S0038-1101(96)00187-6
M3 - Article
AN - SCOPUS:0031096333
SN - 0038-1101
VL - 41
SP - 381
EP - 385
JO - Solid-State Electronics
JF - Solid-State Electronics
IS - 3
ER -