Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment

Hong Chih Chen, Chuan Wei Kuo, Ting Chang Chang, Wei Chih Lai, Po Hsun Chen, Guan Fu Chen, Shin Ping Huang, Jian Jie Chen, Kuan Ju Zhou, Chih Cheng Shih, Yu Ching Tsao, Hui Chun Huang, Simon M. Sze